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[IEEE 2018 2nd International Conference on Trends in...

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[IEEE 2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI) - Tirunelveli, India (2018.5.11-2018.5.12)] 2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI) - SET Detection and Radiation Hardened Pipelined 8-Bit ADC Using 180 Nm Technology

Sharma, Manoj, Pal, Pankaj Kumar, Yadav, Sarita
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Year:
2018
Language:
english
DOI:
10.1109/ICOEI.2018.8553700
File:
PDF, 982 KB
english, 2018
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