[IEEE 2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI) - Tirunelveli, India (2018.5.11-2018.5.12)] 2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI) - Fault Area Detection in Leaf Diseases Using K-Means Clustering
Maity, Subhajit, Sarkar, Sujan, Tapadar, A vinaba, Dutta, Ayan, Biswas, Sanket, Nayek, Sayon, Saha, PritamYear:
2018
Language:
english
DOI:
10.1109/ICOEI.2018.8553913
File:
PDF, 478 KB
english, 2018