Electro-Thermal Erasing at 104-Fold Faster Speeds in...

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IEEE Electron Device Letters 2018

Electro-Thermal Erasing at 104-Fold Faster Speeds in Charge-Trap Flash Memory

Kim, Myung-Su, Ahn, Dae-Chul, Park, Jun-Young, Seo, Myungsoo, Kim, Seong-Yeon, Kim, Wu-Kang, Yun, Dae-Hwan, Choi, Yang-Kyu
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Year:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2885092
File:
PDF, 1.10 MB
english, 2018
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