In-Situ TEM Investigation of Controlled VLS Silicon Nanowire Device Formation and Characterization
Alam, S.B., Panciera, F., Norton, M.M, Hansen, O., Ross, F.M., Mølhave, K.Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616012320
Date:
November, 2016
File:
PDF, 149 KB
english, 2016