The Effect of Shallow Trench Isolation and Sinker on the...

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IEEE Transactions on Electron Devices 2018

The Effect of Shallow Trench Isolation and Sinker on the Performance of Dual-Gate LDMOS Device

Chahar, Suman, Rather, G. M., Hakim, Najeeb-ud-din
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2881918
File:
PDF, 1.83 MB
english, 2018
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