![](/img/cover-not-exists.png)
Optical-Fiber Power Meter Comparison between NIST and KRISS
Vayshenker, I., Kim, S.K., Hong, K., Lee, D.-H., Livigni, D.J., Li, X., Lehman, J.H.Volume:
117
Language:
english
Journal:
Journal of Research of the National Institute of Standards and Technology
DOI:
10.6028/jres.117.019
Date:
November, 2012
File:
PDF, 81 KB
english, 2012