Simulation Study of Hetero Dielectric Tri Material Gate...

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AEU - International Journal of Electronics and Communications 2018 / 12

Simulation Study of Hetero Dielectric Tri Material Gate Tunnel FET based Common Source Amplifier Circuit

Dutta, Umesh, Soni, M.K, Pattanaik, Manisha
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Language:
english
Journal:
AEU - International Journal of Electronics and Communications
DOI:
10.1016/j.aeue.2018.12.004
Date:
December, 2018
File:
PDF, 992 KB
english, 2018
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