[IEEE 2018 XIV International Scientific-Technical...

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[IEEE 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2018.10.2-2018.10.6)] 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Basic Parameters and Characteristics of the Op-Amp Based on the BiJFet Array Chip MH2XA030 Intended for the Design of Radiation-Hardened and Cryogenic Analog ICs

Dvornikov, Oleg V., Dziatlau, Valentin L., Tchekhovski, Vladimir A., Prokopenko, Nikolai N., Bugakova, Anna V.
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Year:
2018
Language:
english
DOI:
10.1109/APEIE.2018.8545562
File:
PDF, 2.19 MB
english, 2018
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