[IEEE 2018 2nd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) - Kolkata (2018.5.4-2018.5.5)] 2018 2nd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) - Nondestructive testing image enhancement based on a bag of enhancement functions and Bat algorithm
Dhar, Soumyadip, Roy, Hiranmoy, Chatterjee, AninditaYear:
2018
Language:
english
DOI:
10.1109/IEMENTECH.2018.8465392
File:
PDF, 405 KB
english, 2018