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[IEEE 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro) - Bento Gonçalves, Brazil (2018.8.27-2018.8.31)] 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro) - Characterization by GISAXS and Electrochemical Impedance Spectroscopy of porous oxide films
Huanca, Danilo R., Verdonck, Patrick B., Dias, Carlos E. S., Lima, Lucas P. B., Van Elshocht, Sven, Filho, Sebastiao G. dos Santos, Witters, ThomasYear:
2018
Language:
english
DOI:
10.1109/SBMicro.2018.8511356
File:
PDF, 536 KB
english, 2018