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A Study of the Radiation Hardness of Si and SiC Detectors Using a Xe Ion Beam
Hrubčín, L., Gurov, Yu. B., Zaťko, B., Ivanov, O. M., Mitrofanov, S. V., Rozov, S. V., Sandukovsky, V. G., Semin, V. A., Skuratov, V. A.Volume:
61
Language:
english
Journal:
Instruments and Experimental Techniques
DOI:
10.1134/s0020441218060192
Date:
November, 2018
File:
PDF, 332 KB
english, 2018