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CRITICAL MODEL COMPONENTS AND THEIR FINGERPRINT FEATURES IN THE SIMULATED CONDUCTED RADIO FREQUENCY IMMUNITY OF COMPLEX INTEGRATED CIRCUITS
Su, Tao, Yang, Yehua, Wang, ZixinVolume:
139
Year:
2013
Language:
english
Journal:
Progress In Electromagnetics Research
DOI:
10.2528/pier13040201
File:
PDF, 948 KB
english, 2013