Determination of the Thickness of a Resistive Material Layer in a Finite Volume Conductor using Focused Impedance Method (FIM) – a simulation study
Al-Quaderi, Golam Dastegir, Ahmed, Sayed Parvez, Rabbani, K Siddique-eVolume:
7
Language:
english
Journal:
Bangladesh Journal of Medical Physics
DOI:
10.3329/bjmp.v7i1.25255
Date:
October, 2015
File:
PDF, 1.13 MB
english, 2015