A new methodology for the determination of silicon in plants by wavelength dispersive X-ray fluorescence
Gazulla, Maria Fernanda, Orduña, Mónica, Rodrigo, Marta, Ventura, Maria JesúsLanguage:
english
Journal:
X-Ray Spectrometry
DOI:
10.1002/xrs.2989
Date:
November, 2018
File:
PDF, 192 KB
english, 2018