Voltage Noise and Jitter Analysis for Swept Source Optical...

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Measurement 2018 / 12

Voltage Noise and Jitter Analysis for Swept Source Optical Coherence Tomography using KTa1-xNbxO3 Deflector

Sunaga, Hiroshi, Endo, Kazuma, Ogawa, Takafumi, Shinagawa, Mitsuru, Toyoda, Seiji, Ueno, Masahiro, Sasaki, Yuzo, Chen, Mingchen, Sakamoto, Tadashi
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Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2018.11.091
Date:
December, 2018
File:
PDF, 1.02 MB
english, 2018
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