[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Characterization of Bandgap Engineering on Operative Transistor Devices by Spectral Photon Emission
Beyreuther, A., Vogt, I., Nakamura, T., Fischer, G. G., Motamedi, B., Boir, C.Year:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452497
File:
PDF, 631 KB
english, 2018