[IEEE 2018 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS) - Bhopal, India (2018.2.24-2018.2.25)] 2018 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS) - Analysis of Device Characteristics of Dual material Double gate Strained N-Channel MOSFET
Sharma, Avinash, Toshniwal, Sandeep, Pandey, Rahul, Dwivedi, Arun Dev DharYear:
2018
Language:
english
DOI:
10.1109/sceecs.2018.8546912
File:
PDF, 378 KB
english, 2018