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Thickness-Dependent Resistive Switching Behavior of KCu 7 S 4 /Cu x O/Au Device
Wang, You-Yi, Wang, Zhen-Yu, Peng, Wei, Xu, Ji-Yu, Chen, Shi-Rong, Ye, Bin, Wu, Chun-YanVolume:
19
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2019.15815
Date:
May, 2019
File:
PDF, 4.97 MB
english, 2019