Electrical Characterization of Tungsten Nanowires Deposited...

Nanopages 2006 / 06 Vol. 1; Iss. 2

Electrical Characterization of Tungsten Nanowires Deposited by Focused Ion Beam (FIB)

Horváth, E., Neumann, P. L., Tóth, A. L., Vázsonyi, É., Koós, A. A., Horváth, Z. E., Fürjes, P., Dücső, C., Biró, L. P.
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Volume:
1
Language:
english
Journal:
Nanopages
DOI:
10.1556/nano.1.2006.2.10
Date:
June, 2006
File:
PDF, 786 KB
english, 2006
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