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Metallographic Sectioning and Grinding Damage Analysis Through the Use of Color Metallography and Electron Backscatter Diffraction (EBSD)
Lucas, GM, Voort, GF Vander, Philippe, P, Lagacé, M, Hovington, PVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093246
Date:
July, 2009
File:
PDF, 481 KB
english, 2009