Restorative effect of oxygen annealing on device...

Restorative effect of oxygen annealing on device performance in HfIZO thin-film transistors

Ha, Tae-Jun
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Volume:
5
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4916643
Date:
March, 2015
File:
PDF, 2.67 MB
english, 2015
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