[IEEE NAECON 2018 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2018.7.23-2018.7.26)] NAECON 2018 - IEEE National Aerospace and Electronics Conference - A Leaf Recognition Approach to Plant Classification Using Machine Learning
Ali, Redha, Hardie, Russell, Essa, AlmabrokYear:
2018
Language:
english
DOI:
10.1109/NAECON.2018.8556785
File:
PDF, 1.35 MB
english, 2018