[IEEE 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV (2018.9.23-2018.9.28)] 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Undesired Effects of CDM Stressing Non-Connected Pins
Smedes, Theo, OrSullivan, Greg, Derikx, Richard, Garcia, Artemio, Knoppers, BobYear:
2018
Language:
english
DOI:
10.23919/EOS/ESD.2018.8509750
File:
PDF, 1.48 MB
english, 2018