![](/img/cover-not-exists.png)
[IEEE 2018 IEEE 7th Data Driven Control and Learning Systems Conference (DDCLS) - Enshi (2018.5.25-2018.5.27)] 2018 IEEE 7th Data Driven Control and Learning Systems Conference (DDCLS) - Yarn-dyed Fabric Defect Detection with YOLOV2 Based on Deep Convolution Neural Networks
Zhang, Hong-wei, Zhang, Ling-jie, Li, Peng-fei, Gu, DeYear:
2018
Language:
english
DOI:
10.1109/DDCLS.2018.8516094
File:
PDF, 2.74 MB
english, 2018