[IEEE 2018 IEEE East-West Design & Test Symposium (EWDTS) - Kazan (2018.9.14-2018.9.17)] 2018 IEEE East-West Design & Test Symposium (EWDTS) - Firmware Generation Architecture for Memory BIST
Sargsyan, D.Year:
2018
Language:
english
DOI:
10.1109/EWDTS.2018.8524853
File:
PDF, 200 KB
english, 2018