XPS study of silicon spheres as a density standard

Surface and Interface Analysis 2018 / 12

XPS study of silicon spheres as a density standard

Zhang, Lulu, Kuramoto, Naoki, Kurokawa, Akira, Fujii, Kenichi
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Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6594
Date:
December, 2018
File:
PDF, 1005 KB
english, 2018
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