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[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - (Invited) Recent insights in CMOS reliability characterization by the use of degradation maps
Bury, E., Chasin, A., Kaczer, B., Chuang, K.-H., Franco, J., Simicic, M., Weckx, P., Linten, D.Year:
2018
Language:
english
DOI:
10.1109/ICSICT.2018.8565676
File:
PDF, 7.19 MB
english, 2018