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On the Prediction of the Threshold Voltage Degradation in CMOS Technology Due to Bias-Temperature Instability
Campos-Cruz, Alejandro, Espinosa-Flores-Verdad, Guillermo, Torres-Jacome, Alfonso, Tlelo-Cuautle, EstebanVolume:
7
Language:
english
Journal:
Electronics
DOI:
10.3390/electronics7120427
Date:
December, 2018
File:
PDF, 7.45 MB
english, 2018