Structural and electrical characterization of thick GaN...

Journal of Applied Physics 2019 / 02 Vol. 125; Iss. 8

Structural and electrical characterization of thick GaN layers on Si, GaN, and engineered substrates

Tanaka, Atsunori, Choi, Woojin, Chen, Renjie, Liu, Ren, Mook, William M., Jungjohann, Katherine L., Yu, Paul K. L., Dayeh, Shadi A.
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Volume:
125
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5049393
Date:
February, 2019
File:
PDF, 6.35 MB
english, 2019
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