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[IEEE 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - Atlanta, GA, USA (2017.10.21-2017.10.28)] 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - Characterization of a new HV/HR CMOS Sensor in LF150nm Process for the ATLAS Inner Tracker Upgrade
Degerli, Y., Balli, F., Barbero, M., Bhat, S., Breugnon, P., Chen, Z., Elhosni, M., Godiot, S., Guilloux, F., Guyot, C., Hemperek, T., Hirono, T., Iguaz, F. J., Kruger, H., Lachkar, M., Liu, J., MeyerYear:
2017
Language:
english
DOI:
10.1109/NSSMIC.2017.8532967
File:
PDF, 1.08 MB
english, 2017