Thin-film growth and structural characterization of a novel...

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Semiconductor Science and Technology 2018 / 12

Thin-film growth and structural characterization of a novel layered iridate Ba7Ir3O13+δ

Miao, Ludi, Xin, Y, Liu, Jinyu, Zhu, Huiwen, Xu, Hong, Talbayev, Diyar, Stanislavchuk, Taras, Sirenko, Andrei, Puli, Venkata S, Mao, Zhiqiang
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Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aaf74e
Date:
December, 2018
File:
PDF, 6.88 MB
english, 2018
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