[IEEE 2018 International Wafer Level Packaging Conference (IWLPC) - San Jose, CA, USA (2018.10.23-2018.10.25)] 2018 International Wafer Level Packaging Conference (IWLPC) - Development of Low Temperature Direct Bond Interconnect Technology for Die-To-Wafer and Die-To-Die Applications-Stacking, Yield Improvement, Reliability Assessment
Gao, Guilian, Mirkarimi, Laura, Workman, Thomas, Guevara, Gabe, Theil, Jeremy, Uzoh, Cyprian, Fountain, Gill, Lee, Bongsub, Mrozek, Pawel, Huynh, Michael, Katkar, RajeshYear:
2018
Language:
english
DOI:
10.23919/IWLPC.2018.8573278
File:
PDF, 423 KB
english, 2018