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[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - A Study on the Voltage-Clamping caused by Dynamic Avalanche at Over-stress Turn-Off of GCTs
Yang, Wu-Hua, Wang, Cai-LinYear:
2018
Language:
english
DOI:
10.1109/ICSICT.2018.8565707
File:
PDF, 991 KB
english, 2018