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A new test set compression scheme for circular scan
Zhang, Ling, Mei, Junjin, Yan, BowuVolume:
2018
Language:
english
Journal:
EURASIP Journal on Embedded Systems
DOI:
10.1186/s13639-018-0085-2
Date:
December, 2018
File:
PDF, 574 KB
english, 2018