[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei,...

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[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - Area-Efficient and Reliable Hybrid CMOS/Memristor ECC Circuit for ReRAM Storage

Ishizaka, Mamoru, Shintani, Michihiro, Inoue, Michiko
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Year:
2018
DOI:
10.1109/ATS.2018.00040
File:
PDF, 577 KB
2018
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