[IEEE 2018 Global Smart Industry Conference (GloSIC) -...

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[IEEE 2018 Global Smart Industry Conference (GloSIC) - Chelyabinsk, Russia (2018.11.13-2018.11.15)] 2018 Global Smart Industry Conference (GloSIC) - Fingerprint Model Based on Fingerprint Image Topology and Ridge Count Values

Gudkov, Vladimir, Lepikhova, Daria
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Year:
2018
Language:
english
DOI:
10.1109/GloSIC.2018.8570064
File:
PDF, 400 KB
english, 2018
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