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[IEEE 2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2018.6.21-2018.6.22)] 2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Development of Memristor Characteristic Device Using In-Ga-Zn-O Thin Film
Kurasaki, Ayata, Sugisaki, Sumio, Tanaka, Ryo, Kimura, Mutsumi, Matsuda, TokiyoshiYear:
2018
Language:
english
DOI:
10.1109/IMFEDK.2018.8581953
File:
PDF, 297 KB
english, 2018