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Artificial Bee Colony based Test Data Generation for Data-Flow Testing
Kumar, Sumit, Yadav, D. K., Khan, D. A.Volume:
9
Language:
english
Journal:
Indian Journal of Science and Technology
DOI:
10.17485/ijst/2016/v9i39/100733
Date:
October, 2016
File:
PDF, 785 KB
english, 2016