XRF and SIMS/SNMS analyses of BaxSr1−xTiO3dielectrics

XRF and SIMS/SNMS analyses of BaxSr1−xTiO3dielectrics

U. Breuer, W. Krumpen, F. Fitsilis
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Volume:
375
Language:
english
Pages:
6
DOI:
10.1007/s00216-003-1806-4
Date:
April, 2003
File:
PDF, 637 KB
english, 2003
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