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X-ray photoelectron spectroscopy for detection of the different Si–O bonding states of silicon
Dieter Pleul, Ralf Frenzel, Michael Eschner, Frank SimonVolume:
375
Language:
english
Pages:
6
DOI:
10.1007/s00216-003-1811-7
Date:
April, 2003
File:
PDF, 226 KB
english, 2003