X-ray photoelectron spectroscopy for detection of the...

X-ray photoelectron spectroscopy for detection of the different Si–O bonding states of silicon

Dieter Pleul, Ralf Frenzel, Michael Eschner, Frank Simon
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
375
Language:
english
Pages:
6
DOI:
10.1007/s00216-003-1811-7
Date:
April, 2003
File:
PDF, 226 KB
english, 2003
Conversion to is in progress
Conversion to is failed