![](/img/cover-not-exists.png)
[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - A New Type of Gated-PN TFET to Overcome the Ambipolar and Trap-Assisted Tunneling Effects
Lin, Jyi-Tsong, Yeh, Chih-Ting, Haga, Steve W., Kuo, Cheng-Chun, Chou, Chun-ShuoYear:
2018
Language:
english
DOI:
10.1109/ICSICT.2018.8564862
File:
PDF, 1.86 MB
english, 2018