[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Ru-based Oxide Resistive Random Access Memory for BEOL-Compatible Novel NVM Applications
Feng, Yulin, Huang, Peng, Zhou, Zheng, Zhu, Dongbin, Han, Runze, Ding, Xiangxiang, Liu, Lifeng, Liu, Xiaoyan, Kang, JinfengYear:
2018
Language:
english
DOI:
10.1109/ICSICT.2018.8564908
File:
PDF, 2.73 MB
english, 2018