In-depth profile analysis of thin films deposited on...

In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge–optical emission spectrometry

Beatriz Fernández, Antonio Martín, Nerea Bordel, Rosario Pereiro, Alfredo Sanz-Medel
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Volume:
384
Language:
english
Pages:
11
DOI:
10.1007/s00216-005-0123-5
Date:
February, 2006
File:
PDF, 601 KB
english, 2006
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