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[IEEE 2018 International Semiconductor Conference (CAS) - Sinaia, Romania (2018.10.10-2018.10.12)] 2018 International Semiconductor Conference (CAS) - Message Recovered: A Robust Fault Detection and Reporting Method for Galvanically Isolated IGBT Gate Drivers
Hurez, Ines, Chen, Ted, Vladoianu, Florin, Anghel, Vlad, Brezeanu, GheorgheYear:
2018
Language:
english
DOI:
10.1109/SMICND.2018.8539764
File:
PDF, 1002 KB
english, 2018