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Low voltage scanning electron microscopy and atomic force microscopy: state-of-the-art microscopy techniques for investigations of polymer single crystals
Loos, Joachim, Tian, MingwenVolume:
2
Language:
english
Journal:
e-Polymers
DOI:
10.1515/epoly.2002.2.1.527
File:
PDF, 329 KB
english