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[IEEE 2018 AEIT International Annual Conference - Bari, Italy (2018.10.3-2018.10.5)] 2018 AEIT International Annual Conference - A.C. Arc Flash Analysis: a new derivation method
Scarpino, Pietro Antonio, Reatti, Alberto, Grasso, FrancescoYear:
2018
DOI:
10.23919/AEIT.2018.8577341
File:
PDF, 169 KB
2018