X-ray tomography applied to the void/defect measurement of...

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Materials Research Express 2018 / 12

X-ray tomography applied to the void/defect measurement of hybrid CFRC/SiC composites

Souza, Maria, Pardini, Luiz Claudio, Botelho, Edson Cocchieri, Costa, Michelle
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Language:
english
Journal:
Materials Research Express
DOI:
10.1088/2053-1591/aaf90f
Date:
December, 2018
File:
PDF, 1.34 MB
english, 2018
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