Demonstrating the comparability of certified reference materials
David L. Duewer, Katrice A. Lippa, Stephen E. Long, Karen E. Murphy, Katherine E. Sharpless, Lorna T. Sniegoski, Michael J. Welch, Wataru Tani, Masao UmemotoVolume:
395
Language:
english
Pages:
15
DOI:
10.1007/s00216-009-2949-8
Date:
September, 2009
File:
PDF, 322 KB
english, 2009