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[IEEE 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Salt Lake City, UT, USA (2018.6.18-2018.6.22)] 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Attribute-Centered Loss for Soft-Biometrics Guided Face Sketch-Photo Recognition
Kazemi, Hadi, Soleymani, Sobhan, Dabouei, Ali, Iranmanesh, Mehdi, Nasrabadi, Nasser M.Year:
2018
Language:
english
DOI:
10.1109/CVPRW.2018.00091
File:
PDF, 756 KB
english, 2018