A stress test on 235 U(n, f) in...

EPJ Web of Conferences 2017 Vol. 146

A stress test on 235 U(n, f) in adjustment with HCI and HMI benchmarks

Wu, Haicheng, Qin, Yingcan, Salvatores, Massimo, Plompen, A., Hambsch, F.-J., Schillebeeckx, P., Mondelaers, W., Heyse, J., Kopecky, S., Siegler, P., Oberstedt, S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
146
Year:
2017
Language:
english
Journal:
EPJ Web of Conferences
DOI:
10.1051/epjconf/201714606027
File:
PDF, 785 KB
english, 2017
Conversion to is in progress
Conversion to is failed